Calibration Tab

The Hardware Configuration Calibration Tab has five tabs: Gate Driver Low Board, Gate Driver High Board, Dpt Board, Control Board, and Clamp Board.

For GaN Devices, there is a sixth tab, GaN Board on the far right side. This is for storing GaN Device maximum measurement parameters.

 

In the Calibration tab, click the Read Calibration button to read the calibration values for all installed Si/SiC test modules. Tabs turn green when the reading was successful. If a board is absent (for example, if the Clamp module is not installed on the Test Fixture), or the system cannot read its calibration data, the tab turns red.

Click the Read Calibration button at the bottom of the screen to read the calibration values stored on the various system EEPROMS. The three sections show “not loaded” until you click the Read Calibration button.

 

The screen capture above shows the fields for the Gate Driver Low Board; Other tabs are similar. There are three EEPROMs on each module:

• ID EEPROM: Shows the basic module ID information (if available).
• Auto Calibration: These values are set during teh calibration procedure.
• Factory Calibration: These values are the last set of values measured during calibration.

The Read Calibration... button reads the calibration values form all of the device EEPROMs.

The Reset Calibration button writes the factory calibration to the auto/user calibration fields.

If a GaN Test Board is installed in the PD1500A Test Fixture, a GaN Board tab appears on the far right. The values listed are GaN device test limits; the system reads these values at the beginning of a GaN device test to ensure the device limits are not exceeded. For example, in the main user interface, you might set a maximum V_DS of 1200 Volts but in the GaN Board tab you might set a device V_DS limit of 600 Volts. The 600 Volts overrides the 1200 Volts. R_GOn and R_GOff values are shown in the Results screen and have no effect on the DPT measurement. These values are stored in the GaN Test Board EEPROMs